marking
TOPHigh digital technology power of
DAP will lead the world
Speed up and reduce lead time by within processing system
Division | Innovation | |||||||||||||||||||||||||||||||||||||||||
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Overview |
From the material carry-in to deliver the PCB product, simplification the work processes and product transportation paths by within processing system, and concentrating on reducing Lead Time which is strength of the DAP. |
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Detail |
See the table below Delivery
|
Division | Sample | Mass | |||
---|---|---|---|---|---|
special | Normal | special | Normal | ||
HDI | C Type | 2.9 | 3.5 | 11.0 | 12.0 |
D Type | 3.0 | 3.9 | 12.0 | 13.0 | |
3D Type | 3.4 | 4.3 | 12.5 | 14.0 | |
4D Type | 3.5 | 4.6 | 13.0 | 14.5 | |
Any Layer | 3.6 | 4.8 | 14.0 | 16.5 | |
Average | 3.3 | 4.2 | 11.7 | 13.2 |
Delivery
Operation of Andon System
Division | Innovation |
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Overview | If problems are occurred during producing the products on the line, alarm will be activated to notice the problem and indicate relating locations. And, help to response quickly by visualizing problems of producing line. |
Detail | The Visual management by creating the Andon System to reduce the facility non-operating loss. |
Model Quick Change Standardization
Division | Innovation |
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Overview | Remove unnecessary movements throughout the Model change competition, operation analyze improvement activity and etc, and throughout the activities of standardization and improvement, response to the multi-type models quickly. |
세부내용 | Model Change Analysis / Monitoring |
PCB quality improvement technology with thinner product thickness
Division | Innovation | ||
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Thickness | |||
Detail | PCB Thickness Control |
PCB Bow & Twist |
PCB Stiffness |
Improved PCB micro-circuit implementation ability
Division | Innovation | ||||||||||||||||||||||||||
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Detail |
* Fine Pattern Tech, 30/40 난이도 See the table below Fine Pattern Tech (2Trace Line)
Difficulty 30/40(2Trace)
|
BGA Pitch |
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0.38 Pitch |
0.35 Pitch |
Fine Pattern Tech (2Trace Line) | ||
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Items(µm) | 0.38Pitch | 0.35Pitch |
Line/Space | 40/40µm | 30/40µm |
Ball Pad | 180µm | 170µm |
Annular Ring | 45µm | 40µm |
Difficulty 30/40(2Trace) | |||
---|---|---|---|
Items | Line | Space | PAD |
Single Line | 40 | 40 | 180 |
Double Line | 30 | 40 | 170 |
All Layer Laser Via Hole & Via Filling Method
Division | Innovation | |
---|---|---|
Stack Change | ||
Detail |
Type : All Stack Via L/S=30/40µm S/R Clearance 30µm BGA 0.32pitch |
‘Line stop system’ that prevent the recurrence of inferior products and never move to next processes
Division | Innovation |
---|---|
Overview | System that re-operate after verification by ‘in the field, watch the real problem, understand actual problem’ to improve immediately by assembling the conference with person in charge by activating the Line Stop Alarm |
Detail | Process Flow |
Same test quality to all inspection products can maintain product quality
Division | Innovation |
---|---|
Overview | Methods that compare the appearance of completed PCB product with registered image and images of Camera. Its reliability and productivity is very excellent than visual inspection. |
Detail |
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